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HIGH-RESOLUTION SURFACE STUDY BY INSITU UHV TRANSMISSION ELECTRON-MICROSCOPY

被引：55
作者：
TAKAYANAGI, K
机构：
来源：
ULTRAMICROSCOPY | 1982年 / 8卷 / 1-2期
关键词：
D O I：
10.1016/0304-3991(82)90284-4
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
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页码：145 / 161
页数：17
相关论文
共 41 条
[1]   RECENT ADVANCES IN EPITAXY [J].
BAUER, E ;
POPPA, H .
THIN SOLID FILMS, 1972, 12 (01) :167-+
[2]   OBERFLACHENSTRUKTUREN UND KRISTALLBAUFEHLER IM ELEKTRONENMIKROSKOPISCHEN BILD, UNTERSUCHT AM NACL .1. [J].
BETHGE, H .
PHYSICA STATUS SOLIDI, 1962, 2 (01) :3-27
[3]   DIRECT RESOLUTION OF SURFACE ATOMIC STEPS BY TRANSMISSION ELECTRON-MICROSCOPY [J].
CHERNS, D .
PHILOSOPHICAL MAGAZINE, 1974, 30 (03) :549-556
[4]   APPROXIMATIONS FOR CALCULATION OF HIGH-RESOLUTION ELECTRON-MICROSCOPE IMAGES OF THIN-FILMS [J].
FEJES, PL .
ACTA CRYSTALLOGRAPHICA SECTION A, 1977, 33 (JAN1) :109-&
[5]   ANOMALOUS 1/3 422 DIFFRACTION SPOTS FROM (111) FLAT GOLD CRYSTALLITES - (111) SURFACE RECONSTRUCTION AND MOIRE FRINGES BETWEEN THE SURFACE AND THE BULK [J].
HEYRAUD, JC ;
METOIS, JJ .
SURFACE SCIENCE, 1980, 100 (03) :519-528
[6]  
HONJO G, 1980, P HVEM ANTWERP, V4, P22
[7]  
HONJO G, 1980, P EUREM 80 THE HAGUE, V1, P296
[8]   OBSERVATION OF ATOMIC STEPS OF (111) SURFACE OF A SILICON CRYSTAL USING BRIGHT FIELD ELECTRON-MICROSCOPY [J].
IIJIMA, S .
ULTRAMICROSCOPY, 1981, 6 (01) :41-52
[9]  
IIJIMA S, 1977, OPTIK, V47, P437
[10]  
KAMBE K, 1975, OPTIK, V42, P187
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