SIZE EFFECT IN THE ELECTRICAL-PROPERTIES OF THIN EPITAXIAL BISMUTH-FILMS

被引：14

作者：

ASAHI, H ^{[1
]}

KINBARA, A ^{[1
]}

机构：

[1] UNIV TOKYO,DEPT APPL PHYS,BUNKYO KU,TOKYO 113,JAPAN

来源：

THIN SOLID FILMS | 1980年 / 66卷 / 02期

关键词：

D O I：

10.1016/0040-6090(80)90215-1

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：131 / 137

页数：7

共 10 条

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ASAHI, H ;

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KAWAZU, A .

PHYSICAL REVIEW B, 1974, 9 (08) :3347-3356

[2] ELECTROMAGNETIC PROPERTIES OF THIN EPITAXIAL BI FILMS IN MAGNETIC-FIELDS UP TO 85 KG [J].

ASAHI, H ;

BABA, S ;

KINBARA, A .

JOURNAL OF APPLIED PHYSICS, 1977, 48 (01) :129-132

[3] STRUCTURE AND ELECTRIC-CONDUCTIVITY OF SIZE-QUANTIZED BISMUTH FILMS [J].

BORZYAK, PG ;

VATAMANY.VI ;

KULYUPIN, YA ;

CHUMAK, AA .

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1973, 20 (01) :359-365

[4] ELECTRICAL TRANSPORT PROPERTIES OF THIN BISMUTH FILMS [J].

HOFFMAN, RA ;

FRANKL, DR .

PHYSICAL REVIEW B, 1971, 3 (06) :1825-&

[5]

KOMNIK YF, 1971, SOV PHYS JETP-USSR, V33, P364

[6] ELECTRICAL-RESISTIVITY MODEL FOR POLYCRYSTALLINE FILMS - CASE OF ARBITRARY REFLECTION AT EXTERNAL SURFACES [J].

MAYADAS, AF ;

SHATZKES, M .

PHYSICAL REVIEW B, 1970, 1 (04) :1382-&

[7]

SAWATARI Y, 1964, OYO BUTSURI, V33, P461

[8] THE MEAN FREE PATH OF ELECTRONS IN METALS [J].

SONDHEIMER, EH .

ADVANCES IN PHYSICS, 1952, 1 (01) :1-42

[9] STRESS IN EVAPORATED BISMUTH FILMS DURING AND AFTER DEPOSITION [J].

UOZUMI, K .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1968, 7 (09) :1012-&

[10]

ZEMEL JN, 1978, COMMUNICATION

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