SOFT-X-RAY MAGNETIC CIRCULAR-DICHROISM - A NEW TECHNIQUE FOR PROBING MAGNETIC-PROPERTIES OF MAGNETIC-SURFACES AND ULTRATHIN FILMS

被引：72

作者：

TJENG, LH ^{[1
]}

IDZERDA, YU ^{[1
]}

RUDOLF, P ^{[1
]}

SETTE, F ^{[1
]}

CHEN, CT ^{[1
]}

机构：

[1] USN,RES LAB,WASHINGTON,DC 20375

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1992年 / 109卷 / 2-3期

关键词：

D O I：

10.1016/0304-8853(92)91762-I

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We demonstrate the feasibility of applying the novel soft-X-ray magnetic circular dichroism (SXMCD) technique to investigate the magnetic properties of magnetic surfaces and ultrathin films. Measurements have been carried out on Ni films ot various thickness on a Cu(100) substrate at the Ni L2.3 absorption edges. The SXMCD data exhibit strong temperature and thickness dependence, giving film thickness dependent Curie temperatures and suggesting that a single monolayer of Ni on a Cu(100) substrate may be non-magnetic.

引用

页码：288 / 292

页数：5

共 33 条

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