CORRELATIONS BETWEEN FILM PROPERTIES AND MICROWAVE SURFACE-RESISTANCE FOR YBA2CU3O7-DELTA THIN-FILMS ON MGO

被引：20

作者：

YOUNG, KH

SUN, JZ

机构：

[1] Superconductor Technologies, Inc., Santa Barbara, CA 93111

来源：

JOURNAL OF APPLIED PHYSICS | 1991年 / 70卷 / 07期

关键词：

D O I：

10.1063/1.349227

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Epitaxial YBa2Cu3O7-delta thin films grown by laser ablation on MgO (100) substrates were investigated for microwave applications. By systematically varying the growth conditions, we obtained films with various microstructures, low-frequency superconducting properties, and microwave performance. The surface resistances were determined from a measured unloaded quality factor in a 8.6-GHz microstrip resonator. Surface resistance was found to correlate most directly with the degree of grain alignment as revealed by electron channeling and x-ray diffraction studies. Films grown at optimal conditions gave a scaled surface resistance of 0.6 m-OMEGA at 77 K and 10 GHz.

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页码：3748 / 3752

页数：5

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