DETERMINATION OF THE NUMBER OF IONS IN THE OXFORD ELECTRON-BEAM ION-TRAP

被引：8

作者：

MARGOLIS, HS ^{[1
]}

VARNEY, AJ ^{[1
]}

JARJIS, RA ^{[1
]}

SILVER, JD ^{[1
]}

机构：

[1] UNIV OXFORD,DEPT PHYS,OXFORD OX1 3PU,ENGLAND

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1995年 / 98卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(95)00012-7

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In order to determine absolute numbers of ions trapped in the Oxford electron beam ion trap (EBIT), the efficiency of a lithium-drifted silicon X-ray detector has been characterized over the energy range 1.5-15 keV using the Oxford scanning proton microprobe. Preliminary results for the number densities of neon-like barium and highly charged argon ions are presented.

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页码：562 / 565

页数：4

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