PERIPHERAL IMPERFECTIONS AND THEIR EFFECTS ON EFFICIENCY IN SI(LI) X-RAY-DETECTORS

被引：18

作者：

CAMPBELL, JL

LEIGH, RG

TEESDALE, WJ

机构：

来源：

关键词：

D O I：

10.1016/0168-583X(84)90567-6

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：39 / 43

页数：5

共 7 条

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