INTER-COMPARISON OF EFFICIENCY-CALIBRATION TECHNIQUES FOR SEMICONDUCTOR X-RAY DETECTORS

被引：68

作者：

CAMPBELL, JL ^{[1
]}

MCNELLES, LA ^{[1
]}

机构：

[1] UNIV GUELPH,DEPT PHYS,GUELPH N1G 2W1,ONTARIO,CANADA

来源：

NUCLEAR INSTRUMENTS & METHODS | 1975年 / 125卷 / 02期

关键词：

D O I：

10.1016/0029-554X(75)90270-0

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：205 / 223

页数：19

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