DEPENDENCE OF X-RAY YIELDS IN ARGON, KRYPTON, AND XENON UPON CHARGE STATE OF FLUORINE IONS AT 3597 MEV

被引：70

作者：

MACDONALD, JR

WINTERS, L

BROWN, MD

CHIAO, T

ELLSWORTH, LD

机构：

来源：

PHYSICAL REVIEW LETTERS | 1972年 / 29卷 / 19期

关键词：

D O I：

10.1103/PhysRevLett.29.1291

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1291 / +

页数：1

共 24 条

[11] X-RAY PRODUCTION CROSS SECTIONS [J].

GARCIA, JD .

PHYSICAL REVIEW A, 1970, 1 (05) :1402-&

[12]

GARCIA JD, 1970, PHYS REV A, V1, P380

[13]

KHANDELWAL GS, 1969, ATOM DATA, V1, P103

[14] PRECISE TEST OF Z2 DEPENDENCE OF X-RAY EMISSION INDUCED BY ALPHA PARTICLES AND DEUTERONS [J].

LEWIS, CW ;

NATOWITZ, JB ;

WATSON, RL .

PHYSICAL REVIEW LETTERS, 1971, 26 (09) :481-&

[15] EXPERIMENTAL DETERMINATION OF ELECTRON-TRANSFER CROSS-SECTIONS FOR FLUORINE IONS IN NITROGEN AT ENERGIES FROM 4 TO 54 MEV [J].

MACDONALD, JR ;

SAVOY, SA ;

CHIAO, T ;

ELLSWORTH, LD ;

FERGUSON, SM .

PHYSICAL REVIEW A-GENERAL PHYSICS, 1972, 5 (03) :1188-+

[16] DOUBLE-SCATTERING MECHANISM TO ACCOUNT FOR SI K-X-RAY YIELDS OBSERVED DURING ARGON-ION BOMBARDMENT OF SILICON [J].

MACEK, J ;

CAIRNS, JA ;

BRIGGS, JS .

PHYSICAL REVIEW LETTERS, 1972, 28 (20) :1298-&

[17] ELECTRON-CAPTURE PROCESSES OF 10-40-MEV OXYGEN IONS IN HELIUM, NITROGEN, AND ARGON [J].

MARTIN, FW ;

MACDONALD, JR .

PHYSICAL REVIEW A-GENERAL PHYSICS, 1971, 4 (05) :1974-+

[18] ATOMIC L-SHELL COSTER-KRONIG, AUGER, AND RADIATIVE RATES AND FLOURESCENCE YIELDS FOR NA-TH [J].

MCGUIRE, EJ .

PHYSICAL REVIEW A, 1971, 3 (02) :587-&

[19]

Merzbacher E., 1958, HDB PHYSIK, V34, P166

[20]

RICHARD P, 1972 P INT C INN SHE

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