THE EFFECT OF IMPURITY ON THE FORMATION OF THE SQUARE-ROOT-3X SQUARE-ROOT-3 (R30-DEGREES) SURFACE PHASE OF THE AG-SI(111) SYSTEM

被引：12

作者：

GOTOH, Y ^{[1
]}

CHAUVET, A ^{[1
]}

MANNEVILLE, M ^{[1
]}

KERN, R ^{[1
]}

机构：

[1] CTR RECH MECANISMES CROISSANCE CRISTALLINE,CNRS,CAMPUS UNIV LUMINY,CASE 913,F-13288 MARSEILLE 2,FRANCE

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1981年 / 20卷 / 12期

关键词：

D O I：

10.1143/JJAP.20.L853

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：L853 / L855

页数：3

共 12 条

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[6] COHESIVE ENERGY OF 2-DIMENSIONAL SI(111)-3 X 1 AG AND SI(111)SQUARE ROOT 3-R(30-DEGREES)AG PHASES OF SILVER (DEPOSIT)-SILICON(111) (SUBSTRATE) SYSTEM [J].

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[7]

LELAY G, 1977, J PHYSIQUE, V38, P155

[8] ATOMIC ARRANGEMENT OF THE SI(111)-SQUARE-ROOT3XSQUARE-ROOT3-AG STRUCTURE DERIVED FROM LOW-ENERGY ION-SCATTERING SPECTROSCOPY [J].

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JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (07) :L421-L424

[9] UNTERSUCHUNGEN ZUM SCHICHTWACHSTUM VON SILBER AUF DER SILIZIUM(111)-OBERFLACHE DURCH BEUGUNG LANGSAMER ELEKTRONEN [J].

SPIEGEL, K .

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[10] SURFACE-STRUCTURE OF SI(111)-SQUARE-ROOT-3X-SQUARE-ROOT-3-AG STUDIED BY AVERAGED LEED ANALYSIS [J].

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JAPANESE JOURNAL OF APPLIED PHYSICS, 1981, 20 (05) :L333-L336

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