LONG-RANGE SCANNING FOR SCANNING TUNNELING MICROSCOPY

We report a scanning tunneling microscope (STM) with 500-mu-m x 500-mu-m field of view. It departs from past designs in that a long-range X-Y stage carries the specimen and scans while the STM head is held stationary. The STM head is capable of scanning with a range of 8-mu-m. Combining the capability of tip scanning and X-Y stage scanning yields a wide dynamic range and has useful applications for measuring optical surfaces.