MEASUREMENT AND VISUAL OBSERVATION OF SAMPLE CHARGING EFFECTS ON PRIMARY BEAM FOCUSING IN SECONDARY ION MASS-SPECTROMETRY

被引：6

作者：

APPELHANS, AD

机构：

来源：

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1989年 / 88卷 / 2-3期

关键词：

D O I：

10.1016/0168-1176(89)85014-1

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

引用

页码：161 / 173

页数：13

共 15 条

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[2]

APPELHANS AD, UNPUB ANAL CHEM

[3]

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[4]

BENNINGHOVEN A, 1987, SECONDARY ION MASS S, P881

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BRIGGS, D ;

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BROWN, A ;

VANDENBERG, JA ;

VICKERMAN, JC .

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1985, 40 (5-6) :871-877

[7]

DAHL D, 1988, SIMION PC PS2 USERS

[8]

DAHL DA, 1987, 35TH P AM SOC MASS S, P257

[9] ION AND NEUTRAL BEAM TRACKING WITH A MICROCHANNEL PLATE ARRAY DETECTOR [J].

DELMORE, JE ;

APPELHANS, AD .

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1986, 68 (03) :327-336

[10] A CROSSED ELECTRIC-MAGNETIC FIELD ELECTRON-CAPTURE ION-SOURCE [J].

DELMORE, JE .

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1983, 51 (2-3) :191-205

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