DEVELOPMENT OF A SCANNING MINORITY-CARRIER TRANSIENT SPECTROSCOPY METHOD - APPLICATION TO THE STUDY OF GOLD DIFFUSION IN A SILICON BICRYSTAL

被引：1

作者：

HEISER, T

MESLI, A

SIFFERT, P

机构：

来源：

MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1989年 / 4卷 / 1-4期

关键词：

D O I：

10.1016/0921-5107(89)90290-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：479 / 482

页数：4

共 9 条

[1]

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[3] DEVELOPMENT OF A SCANNING MINORITY-CARRIER TRANSIENT SPECTROSCOPY TECHNIQUE WITH OPTICAL-INJECTION AND FULL TRANSIENT ANALYSIS [J].

HEISER, T ;

MESLI, A ;

COURCELLE, E ;

SIFFERT, P .

JOURNAL OF APPLIED PHYSICS, 1988, 64 (08) :4031-4040

[4]

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[5] COMPLEX NATURE OF GOLD-RELATED DEEP LEVELS IN SILICON [J].

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[7] PROCESS-INDUCED AND GOLD ACCEPTOR DEFECTS IN SILICON [J].

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SIFFERT, P .

PHYSICAL REVIEW B, 1987, 36 (15) :8049-8062

[8]

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[9]

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