DETERMINING THE REFRACTIVE-INDEX AND THICKNESS OF THIN-FILMS FROM PRISM COUPLER MEASUREMENTS

[1] QUICK METHOD FOR DETERMINING CHARACTERISTICS OF A STEP INDEX OPTICAL-WAVEGUIDE [J]. JOURNAL OF APPLIED PHYSICS, 1978, 49 (02) : 917 - 919

[2] Kersten R. Th., 1973, Optics Communications, V9, P427, DOI 10.1016/0030-4018(73)90288-5

[3] KERSTEN RT, 1975, OPT ACTA, V22, P515, DOI 10.1080/713819077

[4] KERSTEN RT, 1975, OPT ACTA, V2, P503

[5] Meyer S. L., 1975, DATA ANAL SCI ENG

[6] SUEMATSU Y, 1972, ELECTRON COMMUN JPN, V55, P82

[7] Tamir T., 1979, INTEGRATED OPTICS, P83

[8] MEASUREMENT OF THIN-FILM PARAMETERS WITH A PRISM COUPLER [J]. APPLIED OPTICS, 1973, 12 (12): : 2901 - 2908

[9] ERROR ANALYSIS OF SYNCANG AND SYNCWANG METHODS FOR MEASUREMENT OF FILM REFRACTIVE-INDEX AND THICKNESS [J]. THIN SOLID FILMS, 1977, 46 (01) : 7 - 15

[10] Wikipedia, 2021, LINEAR REGRESSION

[1] QUICK METHOD FOR DETERMINING CHARACTERISTICS OF A STEP INDEX OPTICAL-WAVEGUIDE [J]. JOURNAL OF APPLIED PHYSICS, 1978, 49 (02) : 917 - 919

[2] Kersten R. Th., 1973, Optics Communications, V9, P427, DOI 10.1016/0030-4018(73)90288-5

[3] KERSTEN RT, 1975, OPT ACTA, V22, P515, DOI 10.1080/713819077

[4] KERSTEN RT, 1975, OPT ACTA, V2, P503

[5] Meyer S. L., 1975, DATA ANAL SCI ENG

[6] SUEMATSU Y, 1972, ELECTRON COMMUN JPN, V55, P82

[7] Tamir T., 1979, INTEGRATED OPTICS, P83

[8] MEASUREMENT OF THIN-FILM PARAMETERS WITH A PRISM COUPLER [J]. APPLIED OPTICS, 1973, 12 (12): : 2901 - 2908

[9] ERROR ANALYSIS OF SYNCANG AND SYNCWANG METHODS FOR MEASUREMENT OF FILM REFRACTIVE-INDEX AND THICKNESS [J]. THIN SOLID FILMS, 1977, 46 (01) : 7 - 15

[10] Wikipedia, 2021, LINEAR REGRESSION