ESCAPE PEAKS AND INTERNAL FLUORESCENCE FOR A SI(LI) DETECTOR AND GENERAL GEOMETRY

被引:24
作者
STATHAM, PJ [1 ]
机构
[1] UNIV CALIF,DEPT ELECT ENGN & COMP SCI,BERKELEY,CA 94720
来源
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1976年 / 9卷 / 11期
关键词
D O I
10.1088/0022-3735/9/11/040
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:1023 / 1023
页数:1
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[Anonymous], ELECT MICROPROBE
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[4]   ESCAPE PEAKS AND INTERNAL FLUORESCENCE IN X-RAY-SPECTRA RECORDED WITH LITHIUM DRIFTED SILICON DETECTORS [J].
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JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1972, 5 (06) :582-&
[5]  
REED SJB, 1975, ELECTRON MICROPROBE, P148
[6]  
STATHAM PJ, 1975, THESIS U CAMBRIDGE