STOCHASTIC ENDOR

Electron-nuclear double-resonance CW experiments often suffer from small signal intensities and other experimental problems because of the long nuclear relaxation times involved. This is particularly true for defects in semiconductors. Considerable progress in terms of noise immunity and sensitivity enhancement is possible by the introduction of a new ENDOR measurement technique termed stochastic ENDOR. In this type of experiment, periodic signals are no longer detected, but single events are measured at arbitrarily chosen radiofrequency values inducing NMR transitions. The measurement technique is explained and first results are presented demonstrating the potential of this method. (C) 1994 Academic Press, Inc.