ANISOTROPIC MICROSTRUCTURE IN EVAPORATED AMORPHOUS GERMANIUM FILMS

[1] SEARCH FOR ANISOTROPIC ELECTRICAL PROPERTIES IN AMORPHOUS GERMANIUM [J]. PHYSICAL REVIEW LETTERS, 1972, 28 (11) : 678 - &

[2] CLARK AR, PRIVATE COMMUNICATIO

[3] HIGH-RESOLUTION ELECTRON MICROSCOPE OBSERVATION OF VOIDS IN AMORPHOUS GE [J]. PHYSICAL REVIEW LETTERS, 1971, 27 (26) : 1794 - &

[4] Ehrenreich H., 1970, Comments on Solid State Physics, V3, P75

[5] OPTICAL EVIDENCE FOR A NETWORK OF CRACKLIKE VOIDS IN AMORPHOUS GERMANIUM [J]. PHYSICAL REVIEW LETTERS, 1971, 27 (25) : 1716 - &

[6] SUBMICROSCOPIC-VOID RESONANCE - EFFECT OF INTERNAL ROUGHNESS ON OPTICAL ABSORPTION [J]. PHYSICAL REVIEW LETTERS, 1971, 27 (07) : 421 - &

[7] Guinier G., 1955, SMALL ANGLE SCATTERI

[8] METTELBACK P, 1962, ACTA PHYS AUSTR, V15, P122

[9] EVIDENCE OF VOIDS WITHIN AS-DEPOSITED STRUCTURE OF GLASSY SILICON [J]. PHYSICAL REVIEW LETTERS, 1969, 23 (20) : 1167 - &

[10] MOSS SC, 1970, 10TH P INT C PHYS SE, P658

[1] SEARCH FOR ANISOTROPIC ELECTRICAL PROPERTIES IN AMORPHOUS GERMANIUM [J]. PHYSICAL REVIEW LETTERS, 1972, 28 (11) : 678 - &

[2] CLARK AR, PRIVATE COMMUNICATIO

[3] HIGH-RESOLUTION ELECTRON MICROSCOPE OBSERVATION OF VOIDS IN AMORPHOUS GE [J]. PHYSICAL REVIEW LETTERS, 1971, 27 (26) : 1794 - &

[4] Ehrenreich H., 1970, Comments on Solid State Physics, V3, P75

[5] OPTICAL EVIDENCE FOR A NETWORK OF CRACKLIKE VOIDS IN AMORPHOUS GERMANIUM [J]. PHYSICAL REVIEW LETTERS, 1971, 27 (25) : 1716 - &

[6] SUBMICROSCOPIC-VOID RESONANCE - EFFECT OF INTERNAL ROUGHNESS ON OPTICAL ABSORPTION [J]. PHYSICAL REVIEW LETTERS, 1971, 27 (07) : 421 - &

[7] Guinier G., 1955, SMALL ANGLE SCATTERI

[8] METTELBACK P, 1962, ACTA PHYS AUSTR, V15, P122

[9] EVIDENCE OF VOIDS WITHIN AS-DEPOSITED STRUCTURE OF GLASSY SILICON [J]. PHYSICAL REVIEW LETTERS, 1969, 23 (20) : 1167 - &

[10] MOSS SC, 1970, 10TH P INT C PHYS SE, P658