RELATIVE TRANSITION-PROBABILITIES FOR THE X-RAY-LINES FROM THE K-LEVEL

被引：28

作者：

HEINRICH, KFJ

FIORI, CE

MYKLEBUST, RL

机构：

[1] Center for Analytical Chemistry, National Bureau of Standards, Washington

来源：

JOURNAL OF APPLIED PHYSICS | 1979年 / 50卷 / 09期

关键词：

D O I：

10.1063/1.326752

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The ratio of emission of the electron-excited Kβ lines to the sum of Kα and Kβ lines was measured for several elements with a lithium-drifted silicon detector. The measured intensities were corrected for background, line overlap, and absorption within the target and within the detector. The results are compared with those obtained by other investigators.

引用

页码：5589 / 5591

页数：3

共 12 条

[1] Fiori C. E., 1978, Scanning Electron Microscopy, 1978, P401
[2] PREDICTION OF CONTINUUM INTENSITY IN ENERGY-DISPERSIVE X-RAY MICROANALYSIS
FIORI, CE
MYKLEBUST, RL
HEINRICH, KFJ
YAKOWITZ, H
[J]. ANALYTICAL CHEMISTRY, 1976, 48 (01) : 172 - 176
[3] FIORI CE, 1978, P ANS C COMPUTERS AC, P139
[4] SOLID-STATE ENERGY-DISPERSION SPECTROMETER FOR ELECTRON-MICROPROBE X-RAY ANALYSIS
FITZGERALD, R
KEIL, K
HEINRICH, KF
[J]. SCIENCE, 1968, 159 (3814) : 528 - +
[5] ERRORS IN THEORETICAL CORRECTION SYSTEMS IN QUANTITATIVE ELECTRON-PROBE MICROANALYSIS - SYNOPSIS
HEINRICH, KF
[J]. ANALYTICAL CHEMISTRY, 1972, 44 (02) : 350 - &
[6] ABSORPTION OF PRIMARY X-RAYS IN ELECTRON-PROBE MICROANALYSIS
HEINRICH, KFJ
YAKOWITZ, H
[J]. ANALYTICAL CHEMISTRY, 1975, 47 (14) : 2408 - 2411
[7] MULLER RO, 1972, SPECTROCHEMICAL ANAL, V57
[8] A SIMPLEX-METHOD FOR FUNCTION MINIMIZATION
NELDER, JA
MEAD, R
[J]. COMPUTER JOURNAL, 1965, 7 (04) : 308 - 313
[9] Nelson G. C., 1970, Atomic Data, V1, P377
[10] SALEM SI, 1972, PHYS REV A, V1, P2147

← 1 2 →