SURFACE ELECTROMIGRATION OF METAL ATOMS ON SI(111) SURFACES STUDIED BY UHV REFLECTION ELECTRON-MICROSCOPY

被引：33

作者：

YAMANAKA, A ^{[1
]}

YAGI, K ^{[1
]}

YASUNAGA, H ^{[1
]}

机构：

[1] UNIV ELECTROCOMMUN,DEPT ELECTR ENGN,CHOFU,TOKYO 182,JAPAN

来源：

ULTRAMICROSCOPY | 1989年 / 29卷 / 1-4期

关键词：

D O I：

10.1016/0304-3991(89)90242-8

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：161 / 167

页数：7

共 9 条

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