SURFACE ELECTROMIGRATION OF METAL ATOMS ON SI(111) SURFACES STUDIED BY UHV REFLECTION ELECTRON-MICROSCOPY

被引:33
作者
YAMANAKA, A [1 ]
YAGI, K [1 ]
YASUNAGA, H [1 ]
机构
[1] UNIV ELECTROCOMMUN,DEPT ELECTR ENGN,CHOFU,TOKYO 182,JAPAN
关键词
D O I
10.1016/0304-3991(89)90242-8
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
收藏
页码:161 / 167
页数:7
相关论文
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