REFLECTION ELECTRON-MICROSCOPY

被引：91

作者：

YAGI, K

机构：

[1] Physics Department, Tokyo Institute of Technology, Oh-okayama, Meguro, Tokyo,152, Japan

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1987年 / 20卷 / 03期

关键词：

D O I：

10.1107/S0021889887086916

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：147 / 160

页数：14

共 74 条

[1]

ASEEF AL, 1984, P EUR REGIONAL C ELE, P1215

[2] DOMAIN-STRUCTURE OF THE SI(111)2X1 SURFACE STUDIED BY REFLECTION ELECTRON-MICROSCOPY [J].

BENNETT, PA ;

OU, H ;

ELIBOL, C ;

COWLEY, JM .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (03) :1634-1635

[3] CAPILLARITY AND STEP INTERACTIONS ON SOLID SURFACES [J].

BLAKELY, JM ;

SCHWOEBEL, RL .

SURFACE SCIENCE, 1971, 26 (01) :321-+

[4]

CLAVERIE A, 1986, 11TH P INT C EL MICR, V2, P1357

[5]

COLLELA R, 1972, ACTA CRYSTALLOGR A, V28, P11

[6]

COLLELA R, 1972, ACTA CRYSTALLOGR A, V28, P16

[7] DIRECT EVIDENCE FOR TERRACE BENDING FROM HE BEAM SCATTERING ON PT(997) [J].

COMSA, G ;

MECHTERSHEIMER, G ;

POELSEMA, B ;

TOMODA, S .

SURFACE SCIENCE, 1979, 89 (1-3) :123-132

[8] SYSTEM FOR REFLECTION ELECTRON-MICROSCOPY AND ELECTRON-DIFFRACTION AT INTERMEDIATE ENERGIES [J].

COWLEY, JM ;

ALBAIN, JL ;

HEMBREE, GG ;

HOJLUNDNIELSEN, PE ;

KOCH, FA ;

LANDRY, JD ;

SHUMAN, H .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1975, 46 (07) :826-829

[9] MICRO-DIFFRACTION, STEM IMAGING AND ELS AT CRYSTAL-SURFACES [J].

COWLEY, JM .

ULTRAMICROSCOPY, 1982, 9 (03) :231-236

[10] SURFACE ENERGIES AND SURFACE-STRUCTURE OF SMALL CRYSTALS STUDIED BY USE OF A STEM INSTRUMENT [J].

COWLEY, JM .

SURFACE SCIENCE, 1982, 114 (2-3) :587-606

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