SYSTEM FOR REFLECTION ELECTRON-MICROSCOPY AND ELECTRON-DIFFRACTION AT INTERMEDIATE ENERGIES

被引：21

作者：

COWLEY, JM ^{[1
]}

ALBAIN, JL ^{[1
]}

HEMBREE, GG ^{[1
]}

HOJLUNDNIELSEN, PE ^{[1
]}

KOCH, FA ^{[1
]}

LANDRY, JD ^{[1
]}

SHUMAN, H ^{[1
]}

机构：

[1] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1975年 / 46卷 / 07期

关键词：

D O I：

10.1063/1.1134346

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：826 / 829

页数：4

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