RESOLUTION LIMITS IN SURFACE SCANNING ELECTRON-MICROSCOPE

被引：23

作者：

CATTO, CJD ^{[1
]}

SMITH, KCA ^{[1
]}

机构：

[1] CAMBRIDGE UNIV,ENGN DEPT,TRUMPINGTON ST,CAMBRIDGE,ENGLAND

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1973年 / 98卷 / AUG期

关键词：

D O I：

10.1111/j.1365-2818.1973.tb03844.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：417 / 435

页数：19

共 23 条

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[2] BISHOP HE, 1966, THESIS U CAMBRIDGE
[3] A NEW HIGH RESOLUTION REFLECTION SCANNING ELECTRON MICROSCOPE
BROERS, AN
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (08) : 1040 - &
[4] BRUINING H, 1954, PHYSICS APPLICATIONS
[5] CATTO CJD, 1971, THESIS U CAMBRIDGE
[6] MULTIPLE SCATTERING OF 5-30 KEV ELECTRONS IN EVAPORATED METAL FILMS .2. RANGE-ENERGY RELATIONS
COSSLETT, VE
THOMAS, RN
[J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1964, 15 (11): : 1283 - &
[7] A SCANNING MICROSCOPE WITH 5 A RESOLUTION
CREWE, AV
WALL, J
[J]. JOURNAL OF MOLECULAR BIOLOGY, 1970, 48 (03) : 375 - &
[8] DEHAAN EF, 1960, ADV ELECTRONICS ELEC, V12, P291
[9] Everhart T. E., 1958, THESIS U CAMBRIDGE
[10] EVERHART TE, 1970, 3 ANN CAMBR STER COL