REFLECTION ELECTRON-MICROSCOPY

被引：91

作者：

YAGI, K

机构：

[1] Physics Department, Tokyo Institute of Technology, Oh-okayama, Meguro, Tokyo,152, Japan

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1987年 / 20卷 / 03期

关键词：

D O I：

10.1107/S0021889887086916

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：147 / 160

页数：14

共 74 条

[11]

COWLEY JM, 1986, IN PRESS HIGH RESOLU

[12] REFLEXION ELECTRON MICROSCOPY USING DIFFRACTED ELECTRONS [J].

HALLIDAY, JS ;

NEWMAN, RC .

BRITISH JOURNAL OF APPLIED PHYSICS, 1960, 11 (04) :158-162

[13] CHEMICAL-ANALYSIS OF SURFACES BY TOTAL-REFLECTION-ANGLE X-RAY SPECTROSCOPY IN RHEED EXPERIMENTS (RHEED-TRAXS) [J].

HASEGAWA, S ;

INO, S ;

YAMAMOTO, Y ;

DAIMON, H .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1985, 24 (06) :L387-L390

[14] ATOMIC RESOLUTION TEM IMAGES OF THE AU(001) RECONSTRUCTED SURFACE [J].

HASEGAWA, T ;

KOBAYASHI, K ;

IKARASHI, N ;

TAKAYANAGI, K ;

YAGI, K .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1986, 25 (05) :L366-L368

[15]

HASEGAWA T, 1986, 11TH P INT C EL MICR, V2, P1345

[16]

HIRSCH PB, 1964, ELECTRON MICROSCOPY

[17] SURFACE-STRUCTURE STUDY OF SI(111) SQUARE-ROOT-3XSQUARE-ROOT-3-AG BY INCIDENT BEAM ROCKING AES METHOD [J].

HORIO, Y ;

ICHIMIYA, A .

SURFACE SCIENCE, 1985, 164 (2-3) :589-601

[18] INELASTIC SCATTERING OF ELECTRONS BY CRYSTALS .1. THEORY OF SMALL-ANGLE INELASTIC SCATTERING [J].

HOWIE, A .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1963, 271 (1344) :268-+

[19] ATOMIC AND OTHER STRUCTURES OF CLEAVED GAAS(110) SURFACES [J].

HSU, T ;

IIJIMA, S ;

COWLEY, JM .

SURFACE SCIENCE, 1984, 137 (2-3) :551-569

[20] REFLECTION ELECTRON-MICROSCOPY (REM) OF VICINAL SURFACES OF FCC METALS [J].

HSU, T .

ULTRAMICROSCOPY, 1983, 11 (2-3) :167-172

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