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DOMAIN-STRUCTURE OF THE SI(111)2X1 SURFACE STUDIED BY REFLECTION ELECTRON-MICROSCOPY
被引:5
作者
:
BENNETT, PA
论文数:
0
引用数:
0
h-index:
0
机构:
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85287
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85287
BENNETT, PA
[
1
]
OU, H
论文数:
0
引用数:
0
h-index:
0
机构:
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85287
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85287
OU, H
[
1
]
ELIBOL, C
论文数:
0
引用数:
0
h-index:
0
机构:
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85287
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85287
ELIBOL, C
[
1
]
COWLEY, JM
论文数:
0
引用数:
0
h-index:
0
机构:
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85287
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85287
COWLEY, JM
[
1
]
机构
:
[1]
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85287
来源
:
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
|
1985年
/ 3卷
/ 03期
关键词
:
D O I
:
10.1116/1.573151
中图分类号
:
TB3 [工程材料学];
学科分类号
:
0805 ;
080502 ;
摘要
:
引用
收藏
页码:1634 / 1635
页数:2
相关论文
共 8 条
[1]
SYSTEM FOR REFLECTION ELECTRON-MICROSCOPY AND ELECTRON-DIFFRACTION AT INTERMEDIATE ENERGIES
COWLEY, JM
论文数:
0
引用数:
0
h-index:
0
机构:
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
COWLEY, JM
ALBAIN, JL
论文数:
0
引用数:
0
h-index:
0
机构:
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
ALBAIN, JL
HEMBREE, GG
论文数:
0
引用数:
0
h-index:
0
机构:
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
HEMBREE, GG
HOJLUNDNIELSEN, PE
论文数:
0
引用数:
0
h-index:
0
机构:
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
HOJLUNDNIELSEN, PE
KOCH, FA
论文数:
0
引用数:
0
h-index:
0
机构:
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
KOCH, FA
LANDRY, JD
论文数:
0
引用数:
0
h-index:
0
机构:
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
LANDRY, JD
SHUMAN, H
论文数:
0
引用数:
0
h-index:
0
机构:
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
SHUMAN, H
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1975,
46
(07)
: 826
-
829
[2]
ROUGHNESS OF CLEAVED SEMICONDUCTOR SURFACES
HENZLER, M
论文数:
0
引用数:
0
h-index:
0
机构:
TH AACHEN,PHYS INST 2,AACHEN,WEST GERMANY
HENZLER, M
[J].
SURFACE SCIENCE,
1973,
36
(01)
: 109
-
122
[3]
LEED-INVESTIGATION OF STEP ARRAYS ON CLEAVED GERMANIUM (111) SURFACES
HENZLER, M
论文数:
0
引用数:
0
h-index:
0
HENZLER, M
[J].
SURFACE SCIENCE,
1970,
19
(01)
: 159
-
&
[4]
HENZLER M, 1974, JPN J APPL PHYS 2 S, V2
[5]
KRIVANEK O, 1983, ULTRAMICROSCOPY, V11, P91
[6]
STRUCTURAL PROPERTIES OF CLEAVED SILICON AND GERMANIUM SURFACES
LANDER, JJ
论文数:
0
引用数:
0
h-index:
0
LANDER, JJ
GOBELL, GW
论文数:
0
引用数:
0
h-index:
0
GOBELL, GW
MORRISON, J
论文数:
0
引用数:
0
h-index:
0
MORRISON, J
[J].
JOURNAL OF APPLIED PHYSICS,
1963,
34
(08)
: 2298
-
+
[7]
PHOTOEMISSION MEASUREMENTS OF STEP-DEPENDENT SURFACE STATES ON CLEAVED SILICON
ROWE, JE
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
ROWE, JE
CHRISTMAN, SB
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
CHRISTMAN, SB
IBACH, H
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
IBACH, H
[J].
PHYSICAL REVIEW LETTERS,
1975,
34
(14)
: 874
-
877
[8]
SI(111)-(2X1) SURFACE - BUCKLING, CHAINS, OR MOLECULES
TROMP, RM
论文数:
0
引用数:
0
h-index:
0
TROMP, RM
SMIT, L
论文数:
0
引用数:
0
h-index:
0
SMIT, L
VANDERVEEN, JF
论文数:
0
引用数:
0
h-index:
0
VANDERVEEN, JF
[J].
PHYSICAL REVIEW LETTERS,
1983,
51
(18)
: 1672
-
1675
←
1
→
共 8 条
[1]
SYSTEM FOR REFLECTION ELECTRON-MICROSCOPY AND ELECTRON-DIFFRACTION AT INTERMEDIATE ENERGIES
COWLEY, JM
论文数:
0
引用数:
0
h-index:
0
机构:
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
COWLEY, JM
ALBAIN, JL
论文数:
0
引用数:
0
h-index:
0
机构:
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
ALBAIN, JL
HEMBREE, GG
论文数:
0
引用数:
0
h-index:
0
机构:
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
HEMBREE, GG
HOJLUNDNIELSEN, PE
论文数:
0
引用数:
0
h-index:
0
机构:
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
HOJLUNDNIELSEN, PE
KOCH, FA
论文数:
0
引用数:
0
h-index:
0
机构:
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
KOCH, FA
LANDRY, JD
论文数:
0
引用数:
0
h-index:
0
机构:
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
LANDRY, JD
SHUMAN, H
论文数:
0
引用数:
0
h-index:
0
机构:
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281
SHUMAN, H
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1975,
46
(07)
: 826
-
829
[2]
ROUGHNESS OF CLEAVED SEMICONDUCTOR SURFACES
HENZLER, M
论文数:
0
引用数:
0
h-index:
0
机构:
TH AACHEN,PHYS INST 2,AACHEN,WEST GERMANY
HENZLER, M
[J].
SURFACE SCIENCE,
1973,
36
(01)
: 109
-
122
[3]
LEED-INVESTIGATION OF STEP ARRAYS ON CLEAVED GERMANIUM (111) SURFACES
HENZLER, M
论文数:
0
引用数:
0
h-index:
0
HENZLER, M
[J].
SURFACE SCIENCE,
1970,
19
(01)
: 159
-
&
[4]
HENZLER M, 1974, JPN J APPL PHYS 2 S, V2
[5]
KRIVANEK O, 1983, ULTRAMICROSCOPY, V11, P91
[6]
STRUCTURAL PROPERTIES OF CLEAVED SILICON AND GERMANIUM SURFACES
LANDER, JJ
论文数:
0
引用数:
0
h-index:
0
LANDER, JJ
GOBELL, GW
论文数:
0
引用数:
0
h-index:
0
GOBELL, GW
MORRISON, J
论文数:
0
引用数:
0
h-index:
0
MORRISON, J
[J].
JOURNAL OF APPLIED PHYSICS,
1963,
34
(08)
: 2298
-
+
[7]
PHOTOEMISSION MEASUREMENTS OF STEP-DEPENDENT SURFACE STATES ON CLEAVED SILICON
ROWE, JE
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
ROWE, JE
CHRISTMAN, SB
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
CHRISTMAN, SB
IBACH, H
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
IBACH, H
[J].
PHYSICAL REVIEW LETTERS,
1975,
34
(14)
: 874
-
877
[8]
SI(111)-(2X1) SURFACE - BUCKLING, CHAINS, OR MOLECULES
TROMP, RM
论文数:
0
引用数:
0
h-index:
0
TROMP, RM
SMIT, L
论文数:
0
引用数:
0
h-index:
0
SMIT, L
VANDERVEEN, JF
论文数:
0
引用数:
0
h-index:
0
VANDERVEEN, JF
[J].
PHYSICAL REVIEW LETTERS,
1983,
51
(18)
: 1672
-
1675
←
1
→