DETERMINATION OF TRANSIENT REGIME OF HOT CARRIERS IN SEMICONDUCTORS, USING THE RELAXATION-TIME APPROXIMATIONS

被引:92
作者
NOUGIER, JP [1 ]
VAISSIERE, JC [1 ]
GASQUET, D [1 ]
ZIMMERMANN, J [1 ]
CONSTANT, E [1 ]
机构
[1] UNIV LILLE 1,CTR HYPERFREQUENCES & SEMICOND,CNRS,LAB 287,F-59650 VILLENEUVE DASCQ,FRANCE
关键词
D O I
10.1063/1.328423
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
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页码:825 / 832
页数:8
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