ANGLE-RESOLVED X-RAY-PHOTOELECTRON SPECTROSCOPY OF HIGHLY ORIENTED PYROLITIC GRAPHITE

被引:11
作者
HOFFMAN, A [1 ]
NYBERG, GL [1 ]
LIESEGANG, J [1 ]
机构
[1] LA TROBE UNIV,ELECTRON SPECT & SURFACE SCI RES CTR,BUNDOORA,VIC 3083,AUSTRALIA
来源
PHYSICAL REVIEW B | 1992年 / 45卷 / 10期
关键词
D O I
10.1103/PhysRevB.45.5679
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Angle-resolved x-ray-photoelectron-spectroscopy and electron-scattering measurements of cleaved and argon-ion-beam-irradiated highly oriented pyrolitic graphite are reported. It has been found that for the cleaved surface the C 1s photoelectron intensity exhibits strong "photoelectron-diffraction" peaks at angles corresponding to the internuclear directions of nearest- and next-nearest-neighbor atoms in adjacent layers. For the irradiated surface only a broad anisotropic angular distribution was measured, suggesting a randomized near-surface structure. This amorphization is confirmed by complementary electron-energy-loss-spectroscopy and low-energy electron-diffraction measurements.
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收藏
页码:5679 / 5682
页数:4
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