A TOPOLOGICAL APPROACH TO MATERIALS CHARACTERIZATION

被引：19

作者：

CEREZO, A ^{[1
]}

HETHERINGTON, MG ^{[1
]}

HYDE, JM ^{[1
]}

MILLER, MK ^{[1
]}

机构：

[1] OAK RIDGE NATL LAB,DIV MET & CERAM,OAK RIDGE,TN 37831

来源：

SCRIPTA METALLURGICA ET MATERIALIA | 1991年 / 25卷 / 06期

关键词：

D O I：

10.1016/0956-716X(91)90429-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

[No abstract available]

引用

页码：1435 / 1440

页数：6

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SMITH, GDW ;

WORRALL, GM .

JOURNAL OF MICROSCOPY-OXFORD, 1989, 154 :215-225

[3] APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS [J].

CEREZO, A ;

GODFREY, TJ ;

SMITH, GDW .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (06) :862-866

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DUDA RO, 1967, AD650926, P28

[6] THE EARLY STAGES OF THE DECOMPOSITION OF ALLOYS [J].

HAASEN, P .

METALLURGICAL TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 1985, 16 (07) :1173-1184

[7]

HETHERINGTON MG, 1990, IN PRESS S P MATER R

[8]

HILBERT D, 1932, ANSCHAULICHE GEOMETR, P254

[9] 3-DIMENSIONAL SKELETONIZATION - PRINCIPLE AND ALGORITHM [J].

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VERBEEK, PW ;

GROEN, FCA .

IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1980, 2 (01) :75-77

[10]

[No title captured]

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