FOURIER RECONSTRUCTION OF DENSITY PROFILES OF THIN-FILMS USING ANOMALOUS X-RAY REFLECTIVITY

被引：73

作者：

SANYAL, MK

SINHA, SK

GIBAUD, A

HUANG, KG

CARVALHO, BL

RAFAILOVICH, M

SOKOLOV, J

ZHAO, X

ZHAO, W

机构：

[1] MIT,DEPT MAT SCI & ENGN,CAMBRIDGE,MA 02139

[2] CUNY QUEENS COLL,DEPT PHYS,FLUSHING,NY 11367

[3] EXXON RES & ENGN CO,CORP RES LABS,ANNANDALE,NJ 08801

来源：

EUROPHYSICS LETTERS | 1993年 / 21卷 / 06期

关键词：

SOLID-SOLID INTERFACES (INC BICRYSTALS); THIN FILM GROWTH; STRUCTURE; AND EPITAXY; LAYER STRUCTURES; INTERCALATION COMPOUNDS AND SUPERLATTICES; GROWTH; AND NONELECTRONIC PROPERTIES;

D O I：

10.1209/0295-5075/21/6/010

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The use of X-ray and neutron reflectivity measurements to determine the density profile across and interface or across thin films has become increasingly popular over the last few years. However, in general convenient model-independent methods of inverting the reflectivity profiles to obtain the density profile have been missing. We present here one such approach using the method of anomalous reflectivity from the substrate and demonstrate its applicability in the case of an organic thin film.

引用

页码：691 / 696

页数：6

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