CREEP OF 6H ALPHA-SILICON CARBIDE SINGLE-CRYSTALS

被引:30
作者
CORMAN, GS
机构
[1] General Electric Company, Schenectady, New York
关键词
D O I
10.1111/j.1151-2916.1992.tb04444.x
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The compressive creep behavior of single-crystal 6H alpha-SiC was measured for orientations parallel to and at 45-degrees to [0001]. Deformation of the 45-degrees orientation was dominated by basal slip. Steady-state creep rates above 10(-7)/s were measured at temperatures as low as 800-degrees-C. An activation energy of 277 kj/mol and a stress -exponent of 3.32 were determined. Creep testing with applied stresses parallel to [0001] was performed at 1650-degrees-C to 1850-degrees-C, yielding a stress exponent and activation energy of 4.93 and 180 kj/mol, respectively. The occurrence of basal slip in the [0001] specimens suggested that significant off-axis stresses were present during testing.
引用
收藏
页码:3421 / 3424
页数:4
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