X-RAY TOPOGRAPHY SETTINGS - WHITE BEAM TOPOGRAPHY AND DIRECT VIEWING DETECTORS, 2-AXIS SPECTROMETER

被引：18

作者：

SAUVAGE, M

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS | 1978年 / 152卷 / 01期

关键词：

D O I：

10.1016/0029-554X(78)90286-0

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：313 / 317

页数：5

共 8 条

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[3] KEHLA V, 1976, REPTS TECHN RES CTR, V2, P5
[4] X-RAY TOPOGRAPHY AND DYNAMICS - DESCRIPTION OF 2 EXPERIMENTS PERFORMED AT LURE DCI
MILTAT, J
[J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 152 (01): : 323 - 329
[5] PETROFF JF, 1978, J CRYST GROWTH, V44
[6] CRYOGENIC X-RAY TOPOGRAPHY USING SYNCHROTRON RADIATION
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SAFA, M
MIDGLEY, D
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1977, 10 (APR1) : 91 - 99
[7] CRYSTAL ASSESSMENT BY X-RAY TOPOGRAPHY USING SYNCHROTRON RADIATION
TANNER, BK
[J]. PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, 1977, 1 (01): : 23 - 56
[8] USE OF SYNCHROTRON RADIATION IN X-RAY-DIFFRACTION TOPOGRAPHY
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NAUKKARINEN, K
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[J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1974, 25 (01): : 93 - 106