EPITAXIAL GROWTH OF DOPED SILICON USING AN IODINE CYCLE

被引:10
作者
TAFT, EA
机构
关键词
D O I
10.1149/1.2408372
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
引用
收藏
页码:1535 / &
相关论文
共 11 条
[1]   EMISSIVITY AT 0.65 MICRON OF SILICON AND GERMANIUM AT HIGH TEMPERATURES [J].
ALLEN, FG .
JOURNAL OF APPLIED PHYSICS, 1957, 28 (12) :1510-1511
[2]   STRUCTURAL IMPERFECTION IN VAPOUR-GROWN SILICON [J].
CHU, TL ;
GAVALER, JR .
PHILOSOPHICAL MAGAZINE, 1964, 9 (102) :993-&
[3]   METHOD FOR MEASURING THICKNESS OF EPITAXIAL SILICON FILMS [J].
DASH, WC .
JOURNAL OF APPLIED PHYSICS, 1962, 33 (07) :2395-&
[4]   RESISTIVITY OF BULK SILICON AND OF DIFFUSED LAYERS IN SILICON [J].
IRVIN, JC .
BELL SYSTEM TECHNICAL JOURNAL, 1962, 41 (02) :387-+
[5]  
KURBATOV BS, 1965, KRISTALLOGRAFIYA, V10, P756
[8]  
NITSCHE R, 1967, FORTSCHR MINERAL, V44, P231
[9]  
ROLSTEN RF, IODIDE METALS METAL, P273