BACKGROUND CORRECTIONS FOR QUANTITATIVE ELECTRON-MICROPROBE ANALYSIS USING A LITHIUM DRIFTED SILICON X-RAY DETECTOR

被引：52

作者：

WARE, NG ^{[1
]}

REED, SJB ^{[1
]}

机构：

[1] AUSTRALIAN NATL UNIV,DEPT GEOPHYS & GEOCHEM,CANBERRA 2600,AUSTRALIA

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1973年 / 6卷 / 03期

关键词：

D O I：

10.1088/0022-3735/6/3/025

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：286 / 288

页数：3

共 6 条

[1] [Anonymous], ELECT MICROPROBE
[2] FONTIJN LA, 1969, 5TH INT C XRAY OPT M, P261
[3] KULENKAMPFF, 1922, ANN PHYS, V69, P548
[4] Philibert, 1963, XRAY OPTICS XRAY MIC, P379
[5] ESCAPE PEAKS AND INTERNAL FLUORESCENCE IN X-RAY-SPECTRA RECORDED WITH LITHIUM DRIFTED SILICON DETECTORS
REED, SJB
WARE, NG
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1972, 5 (06): : 582 - &
[6] PULSE PILE-UP REJECTION IN SI(LI) X-RAY DETECTION SYSTEMS
REED, SJB
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1972, 5 (10): : 997 - &