EXPERIMENTAL-DETERMINATION OF RELATIVE SENSITIVITY IN X-RAY PHOTO-ELECTRON SPECTROSCOPY

被引：8

作者：

YABE, K ^{[1
]}

YAMASHINA, T ^{[1
]}

机构：

[1] HOKKAIDO UNIV, FAC ENGN, DEPT NUCL ENGN, SAPPORO, HOKKAIDO 060, JAPAN

来源：

APPLICATIONS OF SURFACE SCIENCE | 1981年 / 8卷 / 04期

关键词：

D O I：

10.1016/0378-5963(81)90093-3

中图分类号：

学科分类号：

摘要：

引用

页码：387 / 396

页数：10

共 11 条

[1] QUANTITATIVE-ANALYSIS OF ALUMINOSILICATES AND OTHER SOLIDS BY X-RAY PHOTOELECTRON-SPECTROSCOPY
ADAMS, JM
EVANS, S
REID, PI
THOMAS, JM
WALTERS, MJ
[J]. ANALYTICAL CHEMISTRY, 1977, 49 (13) : 2001 - 2008
[2] ESCAPE DEPTHS OF X-RAY (MG K-ALPHA)INDUCED PHOTOELECTRONS AND RELATIVE PHOTOIONIZATION CROSS-SECTIONS FOR 3P SUBSHELL OF ELEMENTS OF 1ST LONG PERIOD
EVANS, S
PRITCHARD, RG
THOMAS, JM
[J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1977, 10 (13): : 2483 - 2498
[3] RELATIVE DIFFERENTIAL SUBSHELL PHOTOIONIZATION CROSS-SECTIONS (MGK-ALPHA) FROM LITHIUM TO URANIUM
EVANS, S
PRITCHARD, RG
THOMAS, JM
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1978, 14 (05) : 341 - 358
[4] HIROKAWA K, 1977, Z ANAL CHEM, V285, P192
[5] JORGENSEN CK, 1973, FARADAY DISCUSS, V54, P269
[6] RELATIVE INTENSITIES IN X-RAY PHOTOELECTRON-SPECTRA .2.
NEFEDOV, VI
SERGUSHIN, NP
SALYN, YV
BAND, IM
TRZHASKOVSKAYA, MB
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1975, 7 (02) : 175 - 185
[7] QUANTITATIVE CHEMICAL-ANALYSIS BY ESCA
PENN, DR
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1976, 9 (01) : 29 - 40
[8] QUANTITATIVE SURFACE ANALYSIS BY X-RAY PHOTOELECTRON-SPECTROSCOPY
POWELL, CJ
LARSON, PE
[J]. APPLIED SURFACE SCIENCE, 1978, 1 (02) : 186 - 201
[9] RELATIVE INTENSITIES IN PHOTOELECTRON-SPECTROSCOPY OF ATOMS AND MOLECULES
REILMAN, RF
MSEZANE, A
MANSON, ST
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1976, 8 (05) : 389 - 394
[10] HARTREE-SLATER SUBSHELL PHOTOIONIZATION CROSS-SECTIONS AT 1254 AND 1487EV
SCOFIELD, JH
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1976, 8 (02) : 129 - 137

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