EXPERIMENTAL EVALUATION OF SOME RAPID SINGLE FLUX QUANTUM CELLS

被引:6
作者
Kwong, Y. K. [1 ]
Nandakumar, V. [1 ]
机构
[1] Tektronix Inc, Superconduct Syst Grp, Beaverton, OR 97077 USA
关键词
OR gates - Single flux quantum cells;
D O I
10.1109/77.233876
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have studied some basic cells in the Rapid Single Flux Quantum family of superconductive logic circuits. An input stage, a buffer, and an OR gate were simulated and laid out for a standard niobium-based fabrication process. The resulting circuits perform properly for clock speeds up to 1 GHz-the highest speed used in this work. For the simpler circuits tested, the measured margins are wide, consistent with simulations, and not very dependent on clock speed. However, margin decreases with increased circuit complexity.
引用
收藏
页码:2666 / 2670
页数:5
相关论文
共 4 条
[1]   Margins and Yield in Single Flux Quantum Logic [J].
Hamilton, Clark A. ;
Gilbert, Kevin C. .
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 1991, 1 (04) :157-163
[2]   RSFQ Logic/Memory Family: A New Josephson-Junction Technology for Sub-Terahertz-Clock-Frequency Digital Systems [J].
Likharev, K. K. ;
Semenov, V. K. .
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 1991, 1 (01) :3-28
[3]  
Polonsky S., 1992, APPL SUP C CHIC IL A
[4]  
Van Duzer T., 1981, PRINCIPLES SUPERCOND, P212