EXCESS NOISE AND REFIRING PROCESSES IN THICK-FILM RESISTORS

被引：35

作者：

PRUDENZIATI, M ^{[1
]}

MORTEN, B ^{[1
]}

MASOERO, A ^{[1
]}

机构：

[1] IST ELETTROTECN NAZL GALILEO FERRARIS,TORINO,ITALY

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1981年 / 14卷 / 07期

关键词：

D O I：

10.1088/0022-3727/14/7/024

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1355 / &

共 9 条

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[3] EFFECTS OF REFIRING PROCESSES ON ELECTRICAL AND STRUCTURAL-PROPERTIES OF THICK-FILM RESISTORS [J].

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[5] ELECTRICAL-CONDUCTION AND CURRENT NOISE MECHANISM IN DISCONTINUOUS METAL-FILMS .1. THEORETICAL [J].

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[6]

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[7] HIGH-VOLTAGE DAMAGE AND LOW-FREQUENCY NOISE IN THICK-FILM RESISTORS [J].

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[8]

VEST RW, UNPUBLISHED

[9]

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