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INFLUENCE OF FINITE METAL OVERLAYER RESISTANCE ON THE EVALUATION OF CONTACT RESISTIVITY
被引:8
作者
:
KOVACS, B
论文数:
0
引用数:
0
h-index:
0
KOVACS, B
MOJZES, I
论文数:
0
引用数:
0
h-index:
0
MOJZES, I
机构
:
来源
:
IEEE TRANSACTIONS ON ELECTRON DEVICES
|
1986年
/ 33卷
/ 09期
关键词
:
D O I
:
10.1109/T-ED.1986.22683
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:1401 / 1403
页数:3
相关论文
共 5 条
[1]
CONTACT RESISTANCE AND CONTACT RESISTIVITY
[J].
BERGER, HH
论文数:
0
引用数:
0
h-index:
0
BERGER, HH
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1972,
119
(04)
:507
-&
[2]
Kellner W., 1975, Siemens Forschungs- und Entwicklungsberichte, V4, P137
[3]
THE EFFECTS OF CONTACT SIZE AND NON-ZERO METAL RESISTANCE ON THE DETERMINATION OF SPECIFIC CONTACT RESISTANCE
[J].
MARLOW, GS
论文数:
0
引用数:
0
h-index:
0
机构:
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16801
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16801
MARLOW, GS
;
DAS, MB
论文数:
0
引用数:
0
h-index:
0
机构:
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16801
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16801
DAS, MB
.
SOLID-STATE ELECTRONICS,
1982,
25
(02)
:91
-94
[4]
CONTACT RESISTANCE OF POLYSILICON SILICON INTERCONNECTIONS
[J].
REEVES, GK
论文数:
0
引用数:
0
h-index:
0
机构:
RMIT, JOINT MICROELECTR RES CTR, MELBOURNE 3000, AUSTRALIA
RMIT, JOINT MICROELECTR RES CTR, MELBOURNE 3000, AUSTRALIA
REEVES, GK
;
HARRISON, HB
论文数:
0
引用数:
0
h-index:
0
机构:
RMIT, JOINT MICROELECTR RES CTR, MELBOURNE 3000, AUSTRALIA
RMIT, JOINT MICROELECTR RES CTR, MELBOURNE 3000, AUSTRALIA
HARRISON, HB
.
ELECTRONICS LETTERS,
1982,
18
(25-2)
:1083
-1085
[5]
A TRANSMISSION-LINE MODEL FOR SILICIDED DIFFUSIONS - IMPACT ON THE PERFORMANCE OF VLSI CIRCUITS
[J].
SCOTT, DB
论文数:
0
引用数:
0
h-index:
0
SCOTT, DB
;
HUNTER, WR
论文数:
0
引用数:
0
h-index:
0
HUNTER, WR
;
SCHICHIJO, H
论文数:
0
引用数:
0
h-index:
0
SCHICHIJO, H
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1982,
29
(04)
:651
-661
←
1
→
共 5 条
[1]
CONTACT RESISTANCE AND CONTACT RESISTIVITY
[J].
BERGER, HH
论文数:
0
引用数:
0
h-index:
0
BERGER, HH
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1972,
119
(04)
:507
-&
[2]
Kellner W., 1975, Siemens Forschungs- und Entwicklungsberichte, V4, P137
[3]
THE EFFECTS OF CONTACT SIZE AND NON-ZERO METAL RESISTANCE ON THE DETERMINATION OF SPECIFIC CONTACT RESISTANCE
[J].
MARLOW, GS
论文数:
0
引用数:
0
h-index:
0
机构:
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16801
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16801
MARLOW, GS
;
DAS, MB
论文数:
0
引用数:
0
h-index:
0
机构:
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16801
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16801
DAS, MB
.
SOLID-STATE ELECTRONICS,
1982,
25
(02)
:91
-94
[4]
CONTACT RESISTANCE OF POLYSILICON SILICON INTERCONNECTIONS
[J].
REEVES, GK
论文数:
0
引用数:
0
h-index:
0
机构:
RMIT, JOINT MICROELECTR RES CTR, MELBOURNE 3000, AUSTRALIA
RMIT, JOINT MICROELECTR RES CTR, MELBOURNE 3000, AUSTRALIA
REEVES, GK
;
HARRISON, HB
论文数:
0
引用数:
0
h-index:
0
机构:
RMIT, JOINT MICROELECTR RES CTR, MELBOURNE 3000, AUSTRALIA
RMIT, JOINT MICROELECTR RES CTR, MELBOURNE 3000, AUSTRALIA
HARRISON, HB
.
ELECTRONICS LETTERS,
1982,
18
(25-2)
:1083
-1085
[5]
A TRANSMISSION-LINE MODEL FOR SILICIDED DIFFUSIONS - IMPACT ON THE PERFORMANCE OF VLSI CIRCUITS
[J].
SCOTT, DB
论文数:
0
引用数:
0
h-index:
0
SCOTT, DB
;
HUNTER, WR
论文数:
0
引用数:
0
h-index:
0
HUNTER, WR
;
SCHICHIJO, H
论文数:
0
引用数:
0
h-index:
0
SCHICHIJO, H
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1982,
29
(04)
:651
-661
←
1
→