DETECTING PHOTOELECTRON IMAGES WITH SEMICONDUCTOR ARRAYS FOR MULTICHANNEL PHOTON-COUNTING

被引：9

作者：

CHOISSER, JP ^{[1
]}

机构：

[1] ELECTR VIS CO, SAN DIEGO, CA 92121 USA

来源：

关键词：

D O I：

10.1117/12.7972142

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：262 / 266

页数：5

共 10 条

[1]

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[2]

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[3]

BEAVER EA, 1971, REV SCIENTIFIC INSTR, V42

[4]

CHOISSER JP, 1976, ADV ELECTRONICS EL B, V40

[5]

CURRIE DG, 1976, P SPIE, V78

[6] ANNEALING PROCEDURE FOR SELF-SCANNED DIODE-ARRAYS [J].

GORDON, RL .

APPLIED OPTICS, 1976, 15 (08) :1909-1911

[7]

JELLEY JV, 1974, P SOC PHOTO OPTICAL, V44

[8]

SOBIESKI S, 1976, P SPIE, V78

[9]

TULL RG, 1975, APPLIED OPTICS, V14

[10]

WILLIAMS J, 1976, P SPIE, V78