ELECTRONIC-STRUCTURE AND PERTURBATIONS - INTERPRETATION IN THE SIO VALENCE STATES

被引:17
作者
ROBBE, JM
SCHAMPS, J
LEFEBVREBRION, H
RASEEV, G
机构
[1] CTR MECAN ONDULATOIRE APPL,F-75019 PARIS,FRANCE
[2] FAC SCI ORSAY,PHOTOPHYS MOLEC LAB,F-91405 ORSAY,FRANCE
[3] CECAM,F-91405 ORSAY,FRANCE
关键词
D O I
10.1016/0022-2852(79)90161-9
中图分类号
O64 [物理化学(理论化学)、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号
070203 ; 070304 ; 081704 ; 1406 ;
摘要
Using SCF-CI wavefunctions, we have calculated energies and spectroscopic constants of low-lying states of SiO. Special attention has been paid to the 3Π states and has led to the prediction of a new state lying close to the observed c3Πi state. Ab initio calculations of parameters characteristic of the perturbations occurring between the valence states of SiO have been performed and compared to experimental deperturbation analysis of Field, Lagerqvist, and Renhorn. © 1979.
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页码:375 / 387
页数:13
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