TOTAL-REFLECTION X-RAY-FLUORESCENCE ANALYSIS WITH SYNCHROTRON-RADIATION MONOCHROMATIZED BY MULTILAYER STRUCTURES

被引：25

作者：

RIEDER, R ^{[1
]}

WOBRAUSCHEK, P ^{[1
]}

LADISICH, W ^{[1
]}

STRELI, C ^{[1
]}

AIGINGER, H ^{[1
]}

GARBE, S ^{[1
]}

GAUL, G ^{[1
]}

KNOCHEL, A ^{[1
]}

LECHTENBERG, F ^{[1
]}

机构：

[1] UNIV HAMBURG, INST ANORGAN & ANGEW CHEM, D-20146 HAMBURG, GERMANY

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1995年 / 355卷 / 2-3期

关键词：

D O I：

10.1016/0168-9002(94)01157-5

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

To achieve lowest detection limits in total reflection X-ray fluorescence analysis (TXRF) synchrotron radiation has been monochromatized by a multilayer structure to obtain a relative broad energy band compared to Bragg single crystals for an efficient excitation. The energy has been set to 14 keV, 17.5 keV, 31 keV and about 55 keV, Detection limits of 20 fg and 150 fg have been achieved for Sr and Cd, respectively.

引用

页码：648 / 653

页数：6

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