TOTAL-REFLECTION X-RAY-FLUORESCENCE ANALYSIS WITH MONOENERGETIC EXCITATION AND FULL SPECTRUM EXCITATION USING ROTATING ANODE X-RAY TUBES

被引:50
作者
LADISICH, W
RIEDER, R
WOBRAUSCHEK, P
AIGINGER, H
机构
[1] Atominstitut der Österreichischen Universitäten, 1020 Wien
关键词
D O I
10.1016/0168-9002(93)90582-3
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A newly constructed measuring chamber for total reflection X-ray fluorescence analysis (TXRF has been tested for several applications. Full spectrum excitation and monoenergetic excitation of the sample are compared using rotating and standing anode tubes as primary radiation source. Advantages and disadvantages of using a W-C multilayer structure as monochromator in TXRF are discussed. Extrapolated detection limits of 170 fg (1 fg = 10(-15) g) for Mn were obtained using a Cu-anode and full spectrum excitation.
引用
收藏
页码:501 / 506
页数:6
相关论文
共 18 条
[1]   METHOD FOR QUANTITATIVE X-RAY-FLUORESCENCE ANALYSIS IN NANOGRAM REGION [J].
AIGINGER, H ;
WOBRAUSC.P .
NUCLEAR INSTRUMENTS & METHODS, 1974, 114 (01) :157-158
[2]  
BATTERMAN BW, 1991, HDB SYNCHROTRON RAD, V3, P130
[3]  
BROGREN G, 1963, ARK FYS, V23, P219
[4]   X-RAY SPECTROMETERS FOR PIXE [J].
CAMPBELL, JL .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1990, 49 (1-4) :115-125
[5]   X AND X-UV MULTILAYERED OPTICS - PRINCIPLES, FABRICATION METHODS, TESTS AND APPLICATIONS [J].
DHEZ, P .
ANNALES DE PHYSIQUE, 1990, 15 (06) :493-527
[6]   TOTAL-REFLECTION X-RAY-FLUORESCENCE ANALYSIS USING MONOCHROMATIC BEAM [J].
IIDA, A ;
GOHSHI, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1984, 23 (11) :1543-1544
[7]   X-RAY-FLUORESCENCE SPECTROMETER WITH TOTALLY REFLECTING SAMPLE SUPPORT FOR TRACE ANALYSIS AT PPB LEVEL [J].
KNOTH, J ;
SCHWENKE, H .
FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1978, 291 (03) :200-204
[8]   A NEW TOTALLY REFLECTING X-RAY-FLUORESCENCE SPECTROMETER WITH DETECTION LIMITS BELOW 10-11 G [J].
KNOTH, J ;
SCHWENKE, H .
FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1980, 301 (01) :7-9
[9]   TOTAL REFLECTION X-RAY-FLUORESCENCE ANALYSIS OF THE RARE-EARTH ELEMENTS BY K-SHELL EXCITATION [J].
KREGSAMER, P ;
WOBRAUSCHEK, P .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1991, 46 (10) :1361-1367
[10]  
REIDER R, 1993, IN PRESS NUCL INST A, V327, P594