TOTAL-REFLECTION X-RAY-FLUORESCENCE ANALYSIS USING MONOCHROMATIC BEAM

[1] XRF ANALYSIS - SOME SENSITIVITY COMPARISONS BETWEEN CHARGED-PARTICLE AND PHOTON EXCITATION [J]. NUCLEAR INSTRUMENTS & METHODS, 1977, 142 (1-2): : 323 - 332

[2] A HIGHLY SENSITIVE ENERGY-DISPERSIVE X-RAY SPECTROMETER WITH MULTIPLE TOTAL REFLECTION OF THE EXCITING BEAM [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 193 (1-2): : 239 - 243

[3] Wobrauschek P., 1979, X-Ray Spectrometry, V8, P57, DOI 10.1002/xrs.1300080204

[4] OPTICAL FLATS FOR USE IN X-RAY SPECTROCHEMICAL MICROANALYSIS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (07) : 1069 - &

[1] XRF ANALYSIS - SOME SENSITIVITY COMPARISONS BETWEEN CHARGED-PARTICLE AND PHOTON EXCITATION [J]. NUCLEAR INSTRUMENTS & METHODS, 1977, 142 (1-2): : 323 - 332

[2] A HIGHLY SENSITIVE ENERGY-DISPERSIVE X-RAY SPECTROMETER WITH MULTIPLE TOTAL REFLECTION OF THE EXCITING BEAM [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 193 (1-2): : 239 - 243

[3] Wobrauschek P., 1979, X-Ray Spectrometry, V8, P57, DOI 10.1002/xrs.1300080204

[4] OPTICAL FLATS FOR USE IN X-RAY SPECTROCHEMICAL MICROANALYSIS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (07) : 1069 - &