A HIGHLY SENSITIVE ENERGY-DISPERSIVE X-RAY SPECTROMETER WITH MULTIPLE TOTAL REFLECTION OF THE EXCITING BEAM

被引：44

作者：

SCHWENKE, H

KNOTH, J

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1982年 / 193卷 / 1-2期

关键词：

D O I：

10.1016/0029-554X(82)90703-0

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：239 / 243

页数：5

共 9 条

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[3] A NEW TOTALLY REFLECTING X-RAY-FLUORESCENCE SPECTROMETER WITH DETECTION LIMITS BELOW 10-11 G
KNOTH, J
SCHWENKE, H
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[4] Knoth J, 1977, J Clin Chem Clin Biochem, V15, P557
[5] TRACE-ELEMENT ENRICHMENT ON A QUARTZ GLASS SURFACE USED AS A SAMPLE SUPPORT OF AN X-RAY SPECTROMETER FOR THE SUB-NANOGRAM RANGE
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SCHWENKE, H
[J]. FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1979, 294 (04): : 273 - 274
[6] SCHWENKE H, 1980, 4TH P INT C NUCL MET
[7] SCHWENKE H, 1980, TRACE ELEMENT ANAL C, P307
[8] TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRIC DETERMINATION OF ELEMENTS IN NANOGRAM AMOUNTS
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[9] OPTICAL FLATS FOR USE IN X-RAY SPECTROCHEMICAL MICROANALYSIS
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