TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRIC DETERMINATION OF ELEMENTS IN NANOGRAM AMOUNTS

被引：99

作者：

WOBRAUSCHEK, P ^{[1
]}

AIGINGER, H ^{[1
]}

机构：

[1] OESTERREICH HSCH,ATOM INST,SCHUETTEL STR 115,A-1020 VIENNA,AUSTRIA

来源：

关键词：

D O I：

10.1021/ac60356a034

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：852 / 855

页数：4

共 8 条

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WOBRAUSC.P
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[2] BLOCHIN MA, 1957, PHYSIK RONTGENSTRAHL
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JOPSON, RC
MARK, H
SWIFT, CD
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[4] GEDCKE DA, 1972, XRAY SPECTROMETRY, V1, P136
[5] Storm E., 1970, ATOM DATA NUCL DATA, V7, P565, DOI [10.1016/S0092-640X(70)80017-1, DOI 10.1016/S0092-640X(70)80017-1]
[6] WEISS WW, 1972, MESSTECHNIK, V80, P127
[7] OPTICAL FLATS FOR USE IN X-RAY SPECTROCHEMICAL MICROANALYSIS
YONEDA, Y
HORIUCHI, T
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (07) : 1069 - &
[8] 1972, APPENDICES TENTATIVE, P17