A NEW TOTALLY REFLECTING X-RAY-FLUORESCENCE SPECTROMETER WITH DETECTION LIMITS BELOW 10-11 G

被引：79

作者：

KNOTH, J

SCHWENKE, H

机构：

来源：

FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE | 1980年 / 301卷 / 01期

关键词：

D O I：

10.1007/BF00481262

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：7 / 9

页数：3

共 6 条

[1] METHOD FOR QUANTITATIVE X-RAY-FLUORESCENCE ANALYSIS IN NANOGRAM REGION
AIGINGER, H
WOBRAUSC.P
[J]. NUCLEAR INSTRUMENTS & METHODS, 1974, 114 (01): : 157 - 158
[2] FREITAG K, GKSS79E9 REP
[3] X-RAY-FLUORESCENCE SPECTROMETER WITH TOTALLY REFLECTING SAMPLE SUPPORT FOR TRACE ANALYSIS AT PPB LEVEL
KNOTH, J
SCHWENKE, H
[J]. FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1978, 291 (03): : 200 - 204
[4] TRACE-ELEMENT ENRICHMENT ON A QUARTZ GLASS SURFACE USED AS A SAMPLE SUPPORT OF AN X-RAY SPECTROMETER FOR THE SUB-NANOGRAM RANGE
KNOTH, J
SCHWENKE, H
[J]. FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1979, 294 (04): : 273 - 274
[5] SCHWENKE H, Patent No. 29115966
[6] OPTICAL FLATS FOR USE IN X-RAY SPECTROCHEMICAL MICROANALYSIS
YONEDA, Y
HORIUCHI, T
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (07) : 1069 - &