TRACE-ELEMENT ENRICHMENT ON A QUARTZ GLASS SURFACE USED AS A SAMPLE SUPPORT OF AN X-RAY SPECTROMETER FOR THE SUB-NANOGRAM RANGE

被引：24

作者：

KNOTH, J

SCHWENKE, H

机构：

[1] Gesellschaft für Kernenergieverwertung in Schiffbau und Schiffahrt mbH, Institut für Physik, Geesthacht

来源：

FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE | 1979年 / 294卷 / 04期

关键词：

Röntgenfluorescenz-Spektrometrie; Spurenelementanreicherung an Quarzglasoberflächen;

D O I：

10.1007/BF00481649

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

A procedure for trace element enrichment on a quartz glass surface by matrix removal is described. It is applied for sample preparation on quartz glass flats which are used as sample supports for an X-ray fluorescence spectrometer yielding minimum detectable limits of about 20 pg. Measurements on the elements Cr, Fe, Co, Ni, Cu, Zn, As, Hg, and Pb gave recovery efficiencies between 97 and 100%. © 1979 Springer-Verlag.

引用

页码：273 / 274

页数：2

共 6 条

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[J]. NUCLEAR INSTRUMENTS & METHODS, 1974, 114 (01): : 157 - 158
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KNAPP, G
SCHREIBER, B
FREI, RW
[J]. ANALYTICA CHIMICA ACTA, 1975, 77 (JUL) : 293 - 297
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KNOTH, J
SCHWENKE, H
[J]. FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1978, 291 (03): : 200 - 204
[4] PRANGE A, 1978, THESIS U HAMBURG
[5] TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRIC DETERMINATION OF ELEMENTS IN NANOGRAM AMOUNTS
WOBRAUSCHEK, P
AIGINGER, H
[J]. ANALYTICAL CHEMISTRY, 1975, 47 (06) : 852 - 855
[6] OPTICAL FLATS FOR USE IN X-RAY SPECTROCHEMICAL MICROANALYSIS
YONEDA, Y
HORIUCHI, T
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (07) : 1069 - &

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