THE ROLE OF LAYER GROWTH ON INTERFACE ROUGHNESS IN NI-C MULTILAYER X-RAY MIRRORS

被引:6
作者
PUIK, EJ [1 ]
VANDERWIEL, MJ [1 ]
ZEIJLEMAKER, H [1 ]
VERHOEVEN, J [1 ]
机构
[1] FOM,INST ATOM & MOLEC PHYS,1098 SJ AMSTERDAM,NETHERLANDS
关键词
D O I
10.1016/0042-207X(88)90447-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:707 / 709
页数:3
相关论文
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