APPLICATION OF INVERTED STRIP DIELECTRIC WAVEGUIDES FOR MEASUREMENT OF THE DIELECTRIC-CONSTANT OF LOW-LOSS MATERIALS AT MILLIMETER-WAVE FREQUENCIES

被引：4

作者：

ITOH, T ^{[1
]}

HSU, FJ ^{[1
]}

机构：

[1] ANACONDA TELEPHONE CO,ANAHEIM,CA 92801

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1979年 / 27卷 / 10期

关键词：

D O I：

10.1109/TMTT.1979.1129745

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An entirely new method for measuring dielectric properties of slab-type materials is developed by using a novel dielectric waveguide structure originally designed for millimeter-wave integrated circuits. The method entails the measurement of the stopband of the grating structure created in the dielectric waveguide. Several examples of measurement results are reported. Copyright © 1979 by The Institute of Electrical and Electronics Engineers, Inc.

引用

页码：841 / 844

页数：4

共 9 条

[1]

COLLIN RE, 1966, F MICROWAVE ENG, pCH8

[2] ACCURATE RESONANT FREQUENCIES OF DIELECTRIC RESONATORS [J].