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OPTICAL MEASUREMENTS ON THIN FILMS OF CONDENSED GASES AT LOW TEMPERATURES
被引:52
作者
:
KRUGER, J
论文数:
0
引用数:
0
h-index:
0
KRUGER, J
AMBS, WJ
论文数:
0
引用数:
0
h-index:
0
AMBS, WJ
机构
:
来源
:
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA
|
1959年
/ 49卷
/ 12期
关键词
:
D O I
:
10.1364/JOSA.49.001195
中图分类号
:
O4 [物理学];
学科分类号
:
0702 ;
摘要
:
引用
收藏
页码:1195 / 1198
页数:4
相关论文
共 7 条
[1]
STABILIZATION OF FREE RADICALS AT LOW TEMPERATURES
BROIDA, HP
论文数:
0
引用数:
0
h-index:
0
BROIDA, HP
[J].
ANNALS OF THE NEW YORK ACADEMY OF SCIENCES,
1957,
67
(09)
: 530
-
&
[2]
GWATHMEY AT, 1951, REV MET, V48, P434
[3]
Heavens O. S., 1955, OPTICAL PROPERTIES T
[4]
PEISER HS, COMMUNICATION
[5]
IMPROVED METHOD TO MEASURE THE THICKNESS OF THIN FILMS WITH A PHOTOELECTRIC ELLIPSOMETER
ROTHEN, A
论文数:
0
引用数:
0
h-index:
0
ROTHEN, A
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1957,
28
(04)
: 283
-
285
[6]
SCHOEN, 1958, REV SCI INSTR, V29, P633
[7]
WINTERBOTTOM AB, 1948, PITTSBURGH INT C SUR, P91
←
1
→
共 7 条
[1]
STABILIZATION OF FREE RADICALS AT LOW TEMPERATURES
BROIDA, HP
论文数:
0
引用数:
0
h-index:
0
BROIDA, HP
[J].
ANNALS OF THE NEW YORK ACADEMY OF SCIENCES,
1957,
67
(09)
: 530
-
&
[2]
GWATHMEY AT, 1951, REV MET, V48, P434
[3]
Heavens O. S., 1955, OPTICAL PROPERTIES T
[4]
PEISER HS, COMMUNICATION
[5]
IMPROVED METHOD TO MEASURE THE THICKNESS OF THIN FILMS WITH A PHOTOELECTRIC ELLIPSOMETER
ROTHEN, A
论文数:
0
引用数:
0
h-index:
0
ROTHEN, A
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1957,
28
(04)
: 283
-
285
[6]
SCHOEN, 1958, REV SCI INSTR, V29, P633
[7]
WINTERBOTTOM AB, 1948, PITTSBURGH INT C SUR, P91
←
1
→