ION-BEAM SYSTEMS FOR SURFACE ANALYSIS

[51] Positive ray analysis of lithium and magnesium. [J]. PHYSICAL REVIEW, 1921, 18 (06): : 415 - 422

[52] DILLON AF, 1968, ADV MASS SPECTROM, V4, P477

[53] DRUAUX J, 1956, ELECTROMAGNETICALLY, P30

[54] ION FOCUSING PROPERTIES OF A QUADRUPOLE LENS PAIR [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1959, 30 (04) : 248 - 251

[55] ION-FOCUSING PROPERTIES OF A 3-ELEMENT QUADRUPOLE LENS SYSTEM [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1961, 32 (06) : 662 - &

[56] Enge HA., 1964, REV SCI INSTRUM, V35, P278

[57] THE SOURCES OF ELECTRON-INDUCED CONTAMINATION IN KINETIC VACUUM SYSTEMS [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1954, 5 (JAN): : 27 - 31

[58] A high efficiency ion source [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1940, 11 (03) : 94 - 97

[59] FREEMAN JH, 1969, AERE6254 REP

[60] FREEMAN JH, 1969, AERE6138 REP

[51] Positive ray analysis of lithium and magnesium. [J]. PHYSICAL REVIEW, 1921, 18 (06): : 415 - 422

[52] DILLON AF, 1968, ADV MASS SPECTROM, V4, P477

[53] DRUAUX J, 1956, ELECTROMAGNETICALLY, P30

[54] ION FOCUSING PROPERTIES OF A QUADRUPOLE LENS PAIR [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1959, 30 (04) : 248 - 251

[55] ION-FOCUSING PROPERTIES OF A 3-ELEMENT QUADRUPOLE LENS SYSTEM [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1961, 32 (06) : 662 - &

[56] Enge HA., 1964, REV SCI INSTRUM, V35, P278

[57] THE SOURCES OF ELECTRON-INDUCED CONTAMINATION IN KINETIC VACUUM SYSTEMS [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1954, 5 (JAN): : 27 - 31

[58] A high efficiency ion source [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1940, 11 (03) : 94 - 97

[59] FREEMAN JH, 1969, AERE6254 REP

[60] FREEMAN JH, 1969, AERE6138 REP