STUDY OF CHARGING AND DISSOCIATION OF SIO2 SURFACES BY AES

被引：152

作者：

CARRIERE, B ^{[1
]}

LANG, B ^{[1
]}

机构：

[1] UNIV LOUIS PASTEUR,MINERAL LAB,F-6700 STRASBOURG,FRANCE

来源：

关键词：

D O I：

10.1016/0039-6028(77)90267-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：209 / 223

页数：15

共 36 条

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[3] CALCULATION OF OPTICAL PROPERTIES OF AMORPHOUS SIOX MATERIALS
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ROTH, LM
[J]. PHYSICAL REVIEW B, 1971, 4 (08): : 2686 - +
[4] BURHOP EHS, 1952, AUGER EFFECT OTHER R
[5] CARRIERE B, 1972, CR ACAD SCI B PHYS, V274, P415
[6] CARRIERE B, 1973, VACUUM, V22, P485
[7] CARRIERE B, UNPUBLISHED RESULTS
[8] CARRIERE B, 1974, SILIC IND, V11, P313
[9] CARRIERE B, TO BE PUBLISHED
[10] AUGER ELECTRON SPECTROSCOPY
CHANG, CC
[J]. SURFACE SCIENCE, 1971, 25 (01) : 53 - +