EXPERIMENTAL LOW-VOLTAGE POINT-PROJECTION MICROSCOPY AND ITS POSSIBILITIES

被引：32

作者：

SPENCE, JCH ^{[1
]}

QIAN, W ^{[1
]}

MELMED, AJ ^{[1
]}

机构：

[1] JOHNS HOPKINS UNIV,DEPT MAT SCI & ENGN,BALTIMORE,MD 21218

来源：

ULTRAMICROSCOPY | 1993年 / 52卷 / 3-4期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0304-3991(93)90063-4

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The design of a lensless, low-voltage point-projection electron microscope is described, operating at 90-400 V. Experimental images of thin carbon films are reported, and it is shown that high-resolution images may be obtained without high-temperature treatment of the tip, greatly simplifying construction and improving stability. Image interpretation, radiation damage, source brightness, tip aberrations and applications of the instrument are discussed, and the effective source size is estimated.

引用

页码：473 / 477

页数：5

共 21 条

[1] FOURIER IMAGES .1. THE POINT SOURCE
COWLEY, JM
MOODIE, AF
[J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1957, 70 (05): : 486 - +
[2] ELECTRON-DIFFRACTION PHENOMENA OBSERVED WITH A HIGH-RESOLUTION STEM INSTRUMENT
COWLEY, JM
[J]. JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1986, 3 (01): : 25 - 44
[3] ATOMIC RESOLUTION IN LENSLESS LOW-ENERGY ELECTRON HOLOGRAPHY
FINK, HW
SCHMID, H
KREUZER, HJ
WIERZBICKI, A
[J]. PHYSICAL REVIEW LETTERS, 1991, 67 (12) : 1543 - 1546
[4] THE FORMATION OF THE DIFFRACTION IMAGE WITH ELECTRONS IN THE GABOR DIFFRACTION MICROSCOPE
HAINE, ME
MULVEY, T
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1952, 42 (10) : 763 - 773
[5] A CONVENIENT METHOD FOR REMOVING SURFACE OXIDES FROM TUNGSTEN STM TIPS
HOCKETT, LA
CREAGER, SE
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (01) : 263 - 264
[6] ELECTRON-BEAM IONIZATION DAMAGE PROCESSES IN PARA-TERPHENYL
HOWIE, A
ROCCA, FJ
VALDRE, U
[J]. PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1985, 52 (03): : 751 - 757
[7] INELASTIC COLLISIONS OF FAST CHARGED PARTICLES WITH ATOMS AND MOLECULES - BETHE THEORY REVISITED
INOKUTI, M
[J]. REVIEWS OF MODERN PHYSICS, 1971, 43 (03) : 297 - &
[8] INTERACTION OF 25 KEV ELECTRONS WITH NUCLEIC-ACID BASES, ADENINE, THYMINE, AND URACIL .2. INNER SHELL EXCITATION AND INELASTIC-SCATTERING CROSS-SECTIONS
ISAACSON, M
[J]. JOURNAL OF CHEMICAL PHYSICS, 1972, 56 (05) : 1813 - &
[9] THEORY OF THE POINT-SOURCE ELECTRON-MICROSCOPE
KREUZER, HJ
NAKAMURA, K
WIERZBICKI, A
FINK, HW
SCHMID, H
[J]. ULTRAMICROSCOPY, 1992, 45 (3-4) : 381 - 403
[10] CALIBRATION OF THE OPERATING PARAMETERS FOR AN HB5 STEM INSTRUMENT
LIN, JA
COWLEY, JM
[J]. ULTRAMICROSCOPY, 1986, 19 (01) : 31 - 42

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