EXPERIMENTAL LOW-VOLTAGE POINT-PROJECTION MICROSCOPY AND ITS POSSIBILITIES

被引:32
作者
SPENCE, JCH [1 ]
QIAN, W [1 ]
MELMED, AJ [1 ]
机构
[1] JOHNS HOPKINS UNIV,DEPT MAT SCI & ENGN,BALTIMORE,MD 21218
基金
美国国家科学基金会;
关键词
D O I
10.1016/0304-3991(93)90063-4
中图分类号
TH742 [显微镜];
学科分类号
摘要
The design of a lensless, low-voltage point-projection electron microscope is described, operating at 90-400 V. Experimental images of thin carbon films are reported, and it is shown that high-resolution images may be obtained without high-temperature treatment of the tip, greatly simplifying construction and improving stability. Image interpretation, radiation damage, source brightness, tip aberrations and applications of the instrument are discussed, and the effective source size is estimated.
引用
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页码:473 / 477
页数:5
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